diff --git a/debian/changelog b/debian/changelog
index 6d9aedd..62bcb7b 100644
--- a/debian/changelog
+++ b/debian/changelog
@@ -1,3 +1,11 @@
+libatasmart (0.18-2) UNRELEASED; urgency=low
+
+  * Add 0003-Add-S.M.A.R.T-attributes-for-Samsung-SSD.patch: Add more
+    attribute names from Samsung SSD. Thanks to Tobias Wolf for the patch!
+    (Closes: #650673, LP: #885869)
+
+ -- Martin Pitt <mpitt@debian.org>  Sun, 26 Feb 2012 18:44:13 +0100
+
 libatasmart (0.18-1) unstable; urgency=low
 
   * New upstream release.
diff --git a/debian/patches/0003-Add-S.M.A.R.T-attributes-for-Samsung-SSD.patch b/debian/patches/0003-Add-S.M.A.R.T-attributes-for-Samsung-SSD.patch
new file mode 100644
index 0000000..8978083
--- /dev/null
+++ b/debian/patches/0003-Add-S.M.A.R.T-attributes-for-Samsung-SSD.patch
@@ -0,0 +1,50 @@
+From 8dc5e62534244acea8cdfc3439bcba8fb67fd846 Mon Sep 17 00:00:00 2001
+From: Tobias Wolf <towolf@gmail.com>
+Date: Sun, 21 Feb 2010 12:58:42 +0100
+Subject: [PATCH] Add S.M.A.R.T attributes for Samsung SSD
+
+  Taken from:
+  http://www.samsung.com/global/business/semiconductor/products/SSD/downloads/ds_SS805_NSSD_100_SLC_SATA_II_rev11.pdf
+
+  Description:
+           Attribute Name
+       175 Program Fail Count (Chip)
+       176 Erase Fail Count (Chip)
+       177 Wear Leveling Count
+       178 Used Reserved Block Count (Chip)
+       179 Used Reserved Block Count (Total)
+       180 Unused Reserved Block Count (Total)
+       181 Program Fail Count (Total)
+       182 Erase Fail Count (Total)
+       183 Runtime bad block (Total)
+
+Bug: https://bugs.freedesktop.org/show_bug.cgi?id=43470
+Bug-Debian: http://bugs.debian.org/650673
+Bug-Ubuntu: https://launchpad.net/bugs/885869
+
+---
+ atasmart.c |    9 +++++++++
+ 1 files changed, 9 insertions(+), 0 deletions(-)
+
+diff --git a/atasmart.c b/atasmart.c
+--- a/atasmart.c
++++ b/atasmart.c
+@@ -1317,6 +1317,15 @@
+         [170] = { "available-reserved-space",    SK_SMART_ATTRIBUTE_UNIT_PERCENT,  NULL },
+         [171] = { "program-fail-count",          SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
+         [172] = { "erase-fail-count",            SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [175] = { "program-fail-count-chip",     SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [176] = { "erase-fail-count-chip",       SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [177] = { "wear-leveling-count",         SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [178] = { "used-reserved-blocks-chip",   SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [179] = { "used-reserved-blocks-total",  SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [180] = { "unused-reserved-blocks",      SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [181] = { "program-fail-count-total",    SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [182] = { "erase-fail-count-total",      SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
++        [183] = { "runtime-bad-blk-total",       SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
+         [184] = { "end-to-end-error",            SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
+         [187] = { "reported-uncorrect",          SK_SMART_ATTRIBUTE_UNIT_SECTORS,  verify_sectors },
+         [188] = { "command-timeout",             SK_SMART_ATTRIBUTE_UNIT_NONE,     NULL },
+-- 
+1.7.0
+
diff --git a/debian/patches/series b/debian/patches/series
index 8605cc9..bba4b27 100644
--- a/debian/patches/series
+++ b/debian/patches/series
@@ -1,2 +1,3 @@
 # Debian patches for libatasmart
 0002-Drop-our-own-many-bad-sectors-heuristic.patch
+0003-Add-S.M.A.R.T-attributes-for-Samsung-SSD.patch